Figure 3From: Identification of simulants for explosives using pixellated X-ray diffractionPixellated diffraction for simulant materials. (a)-(c): Pixel intensity maps for simulant 1, showing the diffraction signal at 15, 20 and 35 keV, with energy windows of 2 keV. The colour bars show the number of counts observed for a 10 minute acquisition. (d)-(f): The mean number of counts measured as a function of scattering angle for the same three energies.Back to article page